Published December 15, 2008 | Version v1
Journal article

Cesium pre-implantation of embedded biological sections

  • 1. Universidade estadual de Santa Cruz, CNPQ, rua Ilheus-Itabuna, km 16, CEP 45650000, Ilheus, BA (Brazil)
  • 2. Enrico Fermi Institute, University of Chicago, 5640 S. Ellis Avenue, Chicago, IL 60637 (United States)
  • 3. Centre de Spectrometrie Nucleaire et de Spectrometrie de Masse, Universite Paris-Sud 11, F91405 ORSAY Cedex (France)

Description

An ion implantation system which allows the implantation of a large surface of a specimen has been used to obtain an homogeneous enrichment with cesium of embedded biological tissues sections. In such a specimen, containing already oxygen at a high concentration, the addition of cesium allows both positive and negative secondary ions to be studied with the highest sensitivity, using the same primary ion source.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.05.029

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.05.029;
PII
S0169-4332(08)01107-0;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
255
Journal Issue
4
Journal Page Range
p. 1151-1153
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
16. international conference on secondary ion mass spectrometry
Acronym
SIMS 16
Dates
29 Oct - 2 Nov 2007
Place
Ishikawa Ongakudo, Kanazawa (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41009313
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CESIUM; GALLIUM IONS; ION IMPLANTATION; ION MICROSCOPY; ION SOURCES; LIQUIDS; MASS SPECTROSCOPY; OXYGEN
Descriptors DEC
ALKALI METALS; CHARGED PARTICLES; ELEMENTS; FLUIDS; IONS; METALS; MICROSCOPY; NONMETALS; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.