Study of the effect of some of the experimental parameters on the x-ray fluorescence determination of traces of hafnia in high purity zirconia

The effect of the following parameters : (i) analytical lines HfLsub(αsub(1)) or HfLsub(βsub(1,6)) or HfLsub(βsub(2)) (ii) detectors - scintillation or gas flow proportional (iii) collimators - fine or coarse (iv) x-ray tube voltage, current and power (v) order of diffraction : I or II of analysing crystal LiF (200), on the precision of the results and the sensitivity of the method in the x-ray fluorescence determination of traces of hafnia in high purity zirconia, has been studied. Philips semiautomatic x-ray spectrometer PW 1220 with associated equipment has been used. Synthetic standards containing HfO2 in the range 20 ppm to 1 % in ZrO2, presented as double layer pellets have been used. LiF (200) analysing crystal, tungsten target x-ray tube, automatic pulse height selection and pulse height discrimination were used in all the cases. The set - 'HfLsub(βsub(1,6)) analytical line, fine collimator and gas flow proportional counter detector' - gave the best performance. (author)