High resolution soft x-ray spectroscopy of low Z K-shell emission from laser-produced plasmas
Creators
- 1. Lawrence Livermore National Laboratory, Livermore, California 94551 (United States)
- 2. NSF ERC for Extreme Ultraviolet Science and Technology and Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, Colorado 80523 (United States)
Description
A large radius, R=44.3 m, high resolution grating spectrometer (HRGS) with 2400 lines/mm variable line spacing has been designed for laser-produced plasma experiments conducted at the Lawrence Livermore National Laboratory Jupiter Laser Facility. The instrument has been run with a low-noise, charge-coupled device detector to record high signal-to-noise spectra in the 10-50 A wavelength range. The instrument can be run with a 10-20 μm wide slit to achieve the best spectral resolving power, approaching 1000 and similar to crystal spectrometers at 12-20 A, or in slitless operation with a small symmetrical emission source. We describe preliminary spectra emitted from various H-like and He-like low Z ion plasmas heated by 100-500 ps (full width at half maximum), 527 nm wavelength laser pulses. This instrument can be developed as a useful spectroscopy platform relevant to laboratory-based astrophysics as well as high energy density plasma studies.
Additional details
Identifiers
- DOI
- 10.1063/1.2968704;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 79
- Journal Issue
- 10
- Journal Page Range
- p. 10E314-10E314.4
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41015969
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ASTROPHYSICS; CHARGE-COUPLED DEVICES; EMISSION; GRATINGS; IONS; K SHELL; LASER-PRODUCED PLASMA; LASERS; LAWRENCE LIVERMORE NATIONAL LABORATORY; NOISE; RESOLUTION; SOFT X RADIATION; SPECTROMETERS; SPECTROSCOPY; X-RAY SOURCES
- Descriptors DEC
- CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELECTRONIC STRUCTURE; IONIZING RADIATIONS; MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; PHYSICS; PLASMA; RADIATION SOURCES; RADIATIONS; SEMICONDUCTOR DEVICES; US DOE; US ORGANIZATIONS; X RADIATION
Optional Information
- Notes
- (c) 2008 American Institute of Physics