Published 1976
| Version v1
Journal article
The analysis of solid surfaces by secondary ion mass spectrometry
Description
A modern method for analysis of solid surfaces is discussed. The experimental conditions and the practical applications are described. Several examples from the literature are also given. (author)
Additional details
Additional titles
- Original title (Romanian)
- Studiul suprafetelor solide prin spectrometria de masa de ioni secundari (SIMS)
Publishing Information
- Journal Title
- Stud. Cercet. Fiz.
- Journal Volume
- 28
- Journal Issue
- 9
- Series
- Stud. Cercet. Fiz.
- Journal Page Range
- 921-939
INIS
- Country of Publication
- Romania
- Country of Input or Organization
- Romania
- INIS RN
- 9379996
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ION BEAMS; ION-ATOM COLLISIONS; MASS SPECTROMETERS; PHYSICAL PROPERTIES; SECONDARY EMISSION; SOLIDS; SURFACES
- Descriptors DEC
- ATOM COLLISIONS; BEAMS; COLLISIONS; EMISSION; ION COLLISIONS; MEASURING INSTRUMENTS; SPECTROMETERS
Optional Information
- Notes
- 69 refs.