Adsorption at liquid interfaces: a comparison of multiple experimental techniques
Creators
- 1. Kansas State Univ., Manhattan, KS (United States). Dept. of Physics
- 2. Northern Illinois Univ., De Kalb, IL (United States). Dept. of Physics
- 3. Bragg Institute, ANSTO, Lucas Heights, New South Wales (Australia)
- 4. Advanced Photon Source, Argonne National Lab., Argonne, IL (United States)
- 5. National Institute of Standards and Technology, Gaithersburg, MD (United States)
- 6. Los Alamos National Lab., NM (United States)
Description
It has proven to be a challenging task to quantitatively resolve the interfacial profile at diffuse interfaces, such as, the adsorption profile near a bulk binary liquid mixture critical point. In this contribution we examine the advantages and disadvantages of a variety of experimental techniques for studying adsorption, including neutron reflectometry, X-ray reflectometry and ellipsometry. Short length scale interfacial features are best resolved using neutron/X-ray reflectometry, whereas, large length scale interfacial features are best resolved using ellipsometry, or in special circumstances, neutron reflectometry. The use of multiple techniques severely limits the shape of the adsorption profile that can describe all experimental data sets. Complex interfaces possessing surface features on many different length scales are therefore best studied using a combination of neutron/X-ray reflectometry and ellipsometry. (authors)
Availability note (English)
Available from doi: <http://dx.doi.org/10.1140/epjst/e2009-00947-2Additional details
Identifiers
Publishing Information
- Journal Title
- European Physical Journal. Special Topics
- Journal Volume
- 167
- Journal Issue
- no.1
- Journal Page Range
- p. 127-132
- ISSN
- 1951-6355
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 41000529
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ADSORPTION; ELLIPSOMETRY; INTERFACES; LIQUIDS; NEUTRON DIFFRACTION; REFLECTION; REFLECTIVITY; X RADIATION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; FLUIDS; IONIZING RADIATIONS; MEASURING METHODS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SORPTION; SURFACE PROPERTIES
Optional Information
- Notes
- 21 refs.