Published February 2009 | Version v1
Journal article

Adsorption at liquid interfaces: a comparison of multiple experimental techniques

  • 1. Kansas State Univ., Manhattan, KS (United States). Dept. of Physics
  • 2. Northern Illinois Univ., De Kalb, IL (United States). Dept. of Physics
  • 3. Bragg Institute, ANSTO, Lucas Heights, New South Wales (Australia)
  • 4. Advanced Photon Source, Argonne National Lab., Argonne, IL (United States)
  • 5. National Institute of Standards and Technology, Gaithersburg, MD (United States)
  • 6. Los Alamos National Lab., NM (United States)

Description

It has proven to be a challenging task to quantitatively resolve the interfacial profile at diffuse interfaces, such as, the adsorption profile near a bulk binary liquid mixture critical point. In this contribution we examine the advantages and disadvantages of a variety of experimental techniques for studying adsorption, including neutron reflectometry, X-ray reflectometry and ellipsometry. Short length scale interfacial features are best resolved using neutron/X-ray reflectometry, whereas, large length scale interfacial features are best resolved using ellipsometry, or in special circumstances, neutron reflectometry. The use of multiple techniques severely limits the shape of the adsorption profile that can describe all experimental data sets. Complex interfaces possessing surface features on many different length scales are therefore best studied using a combination of neutron/X-ray reflectometry and ellipsometry. (authors)

Availability note (English)

Available from doi: <http://dx.doi.org/10.1140/epjst/e2009-00947-2

Additional details

Identifiers

Publishing Information

Journal Title
European Physical Journal. Special Topics
Journal Volume
167
Journal Issue
no.1
Journal Page Range
p. 127-132
ISSN
1951-6355

Optional Information

Notes
21 refs.