Formation of Si-nanoparticles in a microwave reactor: Comparison between experiments and modelling
Creators
- 1. Universitaet Duisburg-Essen, Institut fuer Verbrennung und Gasdynamik (Germany)
Description
The formation and growth of silicon-nanoparticles from silane in a microwave reactor was investigated. Experiments were performed for the following conditions: precursor concentration 380-2530 ppm, pressures of 20-30 mbar, microwave powers 120-300 W. The formed particles were examined in-situ with a particle mass spectrometer. Additionally, particles were collected on grids and analyzed by transmission electron microscopy, X-ray diffraction, and by determining the specific surface area by BET. The particle size was found to be in the range of 5-8 nm in diameter. A simple model was used to simulate the particle formation processes taking place inside the reactor. The microwave energy coupled into the reactor flow was treated as a spatially distributed energy source resulting in a local temperature increase. The particles were assumed to have a monodisperse size distribution. To allow an approximation of their shape they were characterized by their volume and surface area. The model takes nucleation, convection, coagulation, and coalescence into account. The fluid flow inside the microwave reactor was simulated with the commercial CFD-code Fluent
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Nanoparticle Research
- Journal Volume
- 7
- Journal Issue
- 1
- Journal Page Range
- p. 29-41
- ISSN
- 1388-0764
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39094528
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; ENERGY SOURCES; FLUID FLOW; MASS SPECTROMETERS; MICROWAVE RADIATION; NANOSTRUCTURES; PARTICLE SIZE; PARTICLES; SILANES; SILICON; SIMULATION; SPECIFIC SURFACE AREA; SURFACE AREA; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; EVALUATION; HYDRIDES; HYDROGEN COMPOUNDS; MEASURING INSTRUMENTS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC SILICON COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SEMIMETALS; SILICON COMPOUNDS; SIZE; SPECTROMETERS; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2005 Springer