Structural characterization of complex systems using anomalous X-ray scattering (AXS) coupled with synchrotron radiation

An attempt has been made to describe the fundamentals of anomalous X-ray scattering (AXS) and its potential power for characterizing the structure of various materials in the variety of state. The usefulness of this AXS method coupled with the synchrotron radiation source was demonstrated by some selected examples of crystalline and non-crystalline materials. This includes the separation of three partial structure factors of molten CuBr, the accurate estimation of the environmental structure of a specific element in Cu-I-Mo-O type super-ionic conducting glass, the determination of cation distribution in spinel ferrites and the direct determination of the number density of atoms in the near-surface region of oxide thin film formed on the stainless steel surface. (author)