Published January 7, 2016 | Version v1
Journal article

A frequency and sensitivity tunable microresonator array for high-speed quantum processor readout

  • 1. D-Wave Systems, Inc., Burnaby, British Columbia V5G 4M9 (Canada)
  • 2. Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109 (United States)

Description

Superconducting microresonators have been successfully utilized as detection elements for a wide variety of applications. With multiplexing factors exceeding 1000 detectors per transmission line, they are the most scalable low-temperature detector technology demonstrated to date. For high-throughput applications, fewer detectors can be coupled to a single wire but utilize a larger per-detector bandwidth. For all existing designs, fluctuations in fabrication tolerances result in a non-uniform shift in resonance frequency and sensitivity, which ultimately limits the efficiency of bandwidth utilization. Here, we present the design, implementation, and initial characterization of a superconducting microresonator readout integrating two tunable inductances per detector. We demonstrate that these tuning elements provide independent control of both the detector frequency and sensitivity, allowing us to maximize the transmission line bandwidth utilization. Finally, we discuss the integration of these detectors in a multilayer fabrication stack for high-speed readout of the D-Wave quantum processor, highlighting the use of control and routing circuitry composed of single-flux-quantum loops to minimize the number of control wires at the lowest temperature stage

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
119
Journal Issue
1
Journal Page Range
p. 014506-014506.7
ISSN
0021-8979
CODEN
JAPIAU

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47065066
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
CONTROL; D WAVES; DESIGN; DETECTION; EFFICIENCY; FABRICATION; FLUCTUATIONS; INDUCTANCE; LAYERS; POWER TRANSMISSION LINES; READOUT SYSTEMS; SENSITIVITY; TEMPERATURE RANGE 0065-0273 K; WIRES
Descriptors DEC
ELECTRICAL PROPERTIES; PARTIAL WAVES; PHYSICAL PROPERTIES; TEMPERATURE RANGE; VARIATIONS

Optional Information

Notes
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