Published July 1997 | Version v1
Journal article Metadata-only

The computer-controlled ultrahigh vacuum setup for complex surface diagnostics based on the medium energy electron diffractometer DEhCEh-1

Creators

  • 1. AN RU, Tashkent (Uzbekistan). Inst. Ehlektroniki

Description

The new setup for the diagnostics of monocrystal surfaces and submonolayer sandwiches has been created. It is possible to obtain the structural information in the sample from a depth up to about 10 monolayers with locality of about 3 A (LEED(low energy electron diffraction), MEED(medium energy electron diffraction) analyses; Ep∼0 - 2 keV) and the nondestructive analysis data by AES(atomic emission spectroscopy), TCS(total current spectra), SIMS(secondary ion mass spectroscopy). The setup was automatized by standard 'CAMAC' and controlled by computer. A number of the new setup advantages have described. (author). 4 refs

Additional details

Additional titles

Original title (Russian)
Управляемый от EhVM сверхвысоковакуумный стенд комплексной диагностики поверхности на базе дифрактоменра электронов средних энергий DEhCEh-1

Publishing Information

Journal Title
Uzbekiston Fizika Zhurnali
Journal Volume
2
Journal Page Range
p. 66-68.
ISSN
1025-8817
CODEN
UFZHEX

INIS

Country of Publication
Uzbekistan
Country of Input or Organization
Uzbekistan
INIS RN
28065054
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COMPUTERIZED CONTROL SYSTEMS; DIFFRACTOMETERS; ELECTRON BEAMS; ELECTRON DIFFRACTION; KEV RANGE; STRUCTURAL CHEMICAL ANALYSIS; SURFACE PROPERTIES; THIN FILMS
Descriptors DEC
BEAMS; COHERENT SCATTERING; CONTROL SYSTEMS; DIFFRACTION; ENERGY RANGE; FILMS; LEPTON BEAMS; MEASURING INSTRUMENTS; ON-LINE CONTROL SYSTEMS; ON-LINE SYSTEMS; PARTICLE BEAMS; SCATTERING