Published February 2010 | Version v1
Journal article

The effect of the dc bias voltage on the x-ray bremsstrahlung and beam intensities of medium and highly charged ions of argon

  • 1. Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110067 (India)
  • 2. Indira Gandhi Centre for Atomic Research, Kalpakkam 603102, Tamilnadu (India)

Description

X-ray bremsstrahlung measurements from the 18 GHz High Temperature Superconducting Electron Cyclotron Resonance Ion Source, Pantechnik-Delhi Ion Source were measured as a function of negative dc bias voltage, keeping all other source operating parameters fixed and the extraction voltage in the off condition. The optimization of medium and highly charged ions of argon with similar source operating parameters is described. It is observed that the high temperature component of the electron is altered significantly with the help of bias voltage, and the electron population has to be maximized for obtaining higher current.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
81
Journal Issue
2
Journal Page Range
p. 02A323-02A323.3
ISSN
0034-6748
CODEN
RSINAK

Conference

Title
13. international conference on ion sources
Acronym
ICIS 2009
Dates
20-25 Sep 2009
Place
Gatlinburg, TN (United States)

Optional Information

Notes
(c) 2010 American Institute of Physics