Radiation induced frequency and resistance changes in electrolyzed high purity quartz resonators
Description
Radiation induced frequency and resistance changes in precision 5 MHz AT-cut quartz resonators fabricated from electrolyzed, high purity quarts are described. A description is given of the radiation measurement methods, transient and steady-state data, and the results of thermal modeling. It is concluded that SARP optical and Premium-Q quartz may be pure enough as grown that (1) the usual frequency time dependent recovery characteristic of t/sup -1/2/ is not observed; (2) without electrolysis, the impurity levels are nevertheless high enough to cause a significant decrease in Q for a short time following a pulse of ionizing radiation; (3) electrolysis can further reduce radiation response so that impurity effects are no longer significant; and (4) the transient radiation response in electrolyzed quartz is primarily thermal in nature
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS., PC A03/MF A01.Files
10481913.pdf
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Additional details
Publishing Information
- Imprint Pagination
- 27 p.
- Report number
- SAND--78-0102
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 10481913
- Subject category
- S36: MATERIALS SCIENCE; S42: ENGINEERING;
- Descriptors DEI
- FREQUENCY MEASUREMENT; GAMMA RADIATION; PHYSICAL RADIATION EFFECTS; QUARTZ; RESONATORS; TEMPERATURE DEPENDENCE; TRANSIENTS
- Descriptors DEC
- CHALCOGENIDES; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; OXIDES; OXYGEN COMPOUNDS; RADIATION EFFECTS; RADIATIONS; SILICON COMPOUNDS; SILICON OXIDES