Published 2018 | Version v1
Journal article Metadata-only

Preparation, differential thermal analysis and crystal structure of the new quaternary compound CuVInSe3

Creators

  • 1. IPN, Escuela Superior de Ingenieria Quimica e Industrias Extractivas, Av. IPN s/n, Col. Nueva Industrial Vallejo, 07738 Ciudad de Mexico (Mexico)
  • 2. Universidad de Los Andes, Facultad de Ciencias, Departamento de Quimica, Laboratorio de Cristalografia, Merida 5101 (Venezuela, Bolivarian Republic of)
  • 3. Universidad de Los Andes, Facultad de Ciencias, Departamento de Fisica, Centro de Estudios de Semiconductores, Merida 5101 (Venezuela, Bolivarian Republic of)

Description

The crystal structure of the quaternary compound CuVInSe3, belonging to the system (CuInSe2)1 -x(VSe)x with x = 1/2, was analyzed using X-ray powder diffraction data. This material was synthesized by the melt and anneal method and crystallizes in the tetragonal space group P42c (No 112), with unit cell parameters a = 5.7909(4) A, c = 11.625(1) A, V = 389.84(5) A3. The Rietveld refinement of 25 instrumental and structural variables led to Rexp = 6.6%, Rp = 8.7% Rwp = 8.8% and S = 1.3 for 4501 step intensities, and 153 independent reflections. This compound has a normal adamantane structure and is isostructural with CuFeInSe3. The Dta indicates that this compound melts at 1332 K. (author)

Additional details

Publishing Information

Journal Title
Revista Mexicana de Fisica
Journal Volume
64
Journal Issue
6
Journal Page Range
p. 548-552
ISSN
0035-001X
CODEN
RMXFAT

INIS

Country of Publication
Mexico
Country of Input or Organization
Mexico
INIS RN
50049171
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANNEALING; BRAGG REFLECTION; CHALCOGENIDES; CRYSTAL STRUCTURE; CYCLOALKANES; DIFFERENTIAL THERMAL ANALYSIS; POWDERS; QUATERNARY ALLOY SYSTEMS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SPACE GROUPS; X-RAY DIFFRACTION
Descriptors DEC
ALKANES; ALLOY SYSTEMS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; HEAT TREATMENTS; HYDROCARBONS; MATERIALS; MICROSCOPY; ORGANIC COMPOUNDS; REFLECTION; SCATTERING; SYMMETRY GROUPS; THERMAL ANALYSIS