Chemometric evaluation of direct spectrochemical methods in the determination of elements in SiC matrices
Creators
- 1. Department of Chemistry, Faculty of Metallurgy, Technical University of Kosice, 04200 Kosice (Slovakia)
- 2. Elektroschmelzwerk Kempten GmbH, Postfach 1526, 87405 Kempten (Germany)
Description
The chemometric evaluation of the achievement of direct spectrochemical methods for SiC matrices, and the judgement of fulfillment of the defined analytical order is based on the fundamental parameters of the information theory. These parameters, the value of information content, as well as the corresponding measure value were computed from the theoretical tolerance parameters of the analytical order. The computation was repeated for the set of parameters derived from experimental metrological characteristics. This should be extended to complex determination of the degree of accuracy of the tested methods. The testing is based on the analysis of standards with certified mass fraction values by the methods in question. On the basis of determined accuracy values it is possible to calculate to calculate the information content values related to the accuracy values. (authors)
Additional details
Publishing Information
- Journal Title
- Chemical Papers
- Journal Volume
- 51
- Journal Issue
- 2
- Series
- Previous name of the journal Chemical Papers was Chemicke Zvesti (used in present time, too)
- Journal Page Range
- p. 91-94
- ISSN
- 0366-6352
- CODEN
- CHZVAN
INIS
- Country of Publication
- Slovakia
- Country of Input or Organization
- Slovakia
- INIS RN
- 31029192
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- EQUATIONS; EXPERIMENTAL DATA; FLUORESCENCE SPECTROSCOPY; GRAPHITE; PLASMA; PLASMA ARC SPRAYING; SILICON CARBIDES; SILICON OXIDES
- Descriptors DEC
- CARBIDES; CARBON; CARBON COMPOUNDS; CHALCOGENIDES; DATA; DEPOSITION; ELEMENTS; EMISSION SPECTROSCOPY; INFORMATION; MINERALS; NONMETALS; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS; SPECTROSCOPY; SPRAY COATING; SURFACE COATING
Optional Information
- Notes
- 4 tabs., 10 refs.