Published December 10, 2007 | Version v1
Journal article

Convective scheme solution of the Boltzmann transport equation for nanoscale semiconductor devices

  • 1. Electrical and Microsystem Modeling, Sandia National Laboratories, P.O. Box 5800, MS 0316, Albuquerque, NM 87185-0316 (United States)
  • 2. Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI 53706 (United States)

Description

A model for the simulation of the electron energy distribution in nanoscale metal-oxide-semiconductor field-effect transistor (MOSFET) devices, using a kinetic simulation technique, is implemented. The convective scheme (CS), a method of characteristics, is an accurate method of solving the Boltzmann transport equation, a nonlinear integrodifferential equation, for the distribution of electrons in a MOSFET device. The method is used to find probabilities for use in an iterative scheme which iterates to find collision rates in cells. The CS is also a novel approach to 2D semiconductor device simulation. The CS has been extended to handle boundary conditions in 2D as well as to calculation of polygon overlap for polygons of more than three sides. Electron energy distributions in the channel of a MOSFET are presented

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jcp.2007.09.006

Additional details

Identifiers

DOI
10.1016/j.jcp.2007.09.006;
PII
S0021-9991(07)00399-3;

Publishing Information

Journal Title
Journal of Computational Physics
Journal Volume
227
Journal Issue
2
Journal Page Range
p. 1387-1410
ISSN
0021-9991
CODEN
JCTPAH

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.