Published November 20, 1972 | Version v1
Patent Metadata-only

Metal deposit thickness calibration standard

Creators

Description

The calibration standard comprises a spherical support coated with a metal layer of constant thickness said layer being deposited electrolytically or chemically while the support is being brought to a large number of positions about its center. This standard permits to calibrate apparatus adapted to measure thicknesses, in particular through β-ray back-scattering or by means of X-rays

Abstract (French)

L'etalon comprend un support spherique revetu d'une couche metallique d'epaisseur constante, mise en place par voie electrolytique ou chimique pendant que le support est amene a occuper un tres grand nombre de positons autour de son centre. L'etalon permet l'etalonnage d'appareils de mesure d'epaisseurs, notamment par retrodiffusion de rayon beta ou par rayons X

Additional details

Additional titles

Original title (French)
Etalon d'epaisseur de depot metallique
Augmented title (English)
#beta# back-scattering

Publishing Information

Imprint Pagination
5 p.
IPC:
Int. Cl. G01b3/00.
IPC
Int. Cl. G01b3/00.
Patent number
FR patent document 2207593/D/

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
6213398
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
CALIBRATION STANDARDS; ELECTRODEPOSITION; FABRICATION; THICKNESS GAGES
Descriptors DEC
DEPOSITION; ELECTROLYSIS; MEASURING INSTRUMENTS; SURFACE COATING

Optional Information

Notes
Available from Institut National de la Propriete Industrielle, Paris (France).