Published October 31, 2008
| Version v1
Journal article
A study of defects in deformed FeSi alloys using positron annihilation techniques
- 1. Department of Metallurgy and Materials Science, Ghent University, Technologiepark 903, 9052 Ghent (Belgium)
- 2. Department of Subatomic and Radiation Physics, Ghent University, Proeftuinstraat 86, 9000 Ghent (Belgium)
Description
Steels with high amounts of silicon are used in electrical applications due to their low magnetostriction, high electrical resistivity and reduced energy losses, but they exhibit poor formability. The slow positron beam of Gent is used to investigate defects in different deformed FeSi alloys. It was found that the concentration of defects for the alloys deformed at high temperatures are different from the ones related to the alloys deformed at room temperature. These results are correlated to the results of positron annihilation lifetime spectroscopy (PALS)
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2008.05.219Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2008.05.219;
- PII
- S0169-4332(08)01250-6;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 255
- Journal Issue
- 1
- Journal Page Range
- p. 149-152
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 11. international workshop on slow positron beam techniques for solids and surfaces
- Acronym
- LOPOS-11
- Dates
- 9-13 Jul 2007
- Place
- Orleans (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40082958
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNIHILATION; BACKSCATTERING; DEFECTS; ELECTRIC CONDUCTIVITY; ELECTRON DIFFRACTION; IRON SILICIDES; MAGNETOSTRICTION; POSITRON BEAMS; POSITRONS; SCANNING ELECTRON MICROSCOPY; SILICON; SPECTROSCOPY; STEELS; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K
- Descriptors DEC
- ALLOYS; ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; BEAMS; CARBON ADDITIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; INTERACTIONS; IRON ALLOYS; IRON BASE ALLOYS; IRON COMPOUNDS; LEPTON BEAMS; LEPTONS; MAGNETIC PROPERTIES; MATTER; MICROSCOPY; PARTICLE BEAMS; PARTICLE INTERACTIONS; PHYSICAL PROPERTIES; SCATTERING; SEMIMETALS; SILICIDES; SILICON COMPOUNDS; TEMPERATURE RANGE; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.