Organometallic chemical vapor deposition: The roles of precursor design and growth ambient in film properties
Creators
- 1. Georgia Inst. of Tech., Atlanta, GA (United States)
- 2. Florida State Univ., Tallahassee, FL (United States). Dept. of Chemistry
Description
Examples of chemical control in CVD of metallic and ceramic films are highlighted. Specific attention is paid to the complexity of precursor design. The effect of reactor environment on growth chemistry is investigated. Examples where reducing or oxidizing atmosphere provide a high level of control over deposit composition are outlined. The system examined centers on yttrium and yttria. These materials are, in general, desired less for their optical or electronic properties and more for their structural properties. Thus, the rigid purity demands of the microelectronics industry are somewhat relaxed. Nevertheless, critical attention must be paid to the issues of vapor pressure and decomposition profile. Where sufficient data is available to justify it, some explanation of the issues relevant to vapor pressure is presented
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (United States)
- ISBN
- 1-55899-264-2
- Imprint Title
- Chemical vapor deposition of refractory metals and ceramics III
- Imprint Pagination
- 297 p.
- Series
- Materials Research Society symposium proceedings, Volume 363.
- Journal Page Range
- p. 195-206.
Conference
- Title
- 1994 fall meeting of the Materials Research Society (MRS).
- Dates
- 28 Nov - 2 Dec 1994.
- Place
- Boston, MA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 26072756
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTRA; CHEMICAL REACTIONS; CHEMICAL VAPOR DEPOSITION; ELECTRON SPECTROSCOPY; NUCLEAR MAGNETIC RESONANCE; ORGANOMETALLIC COMPOUNDS; OXIDATION; SCANNING ELECTRON MICROSCOPY; THERMAL GRAVIMETRIC ANALYSIS; VAPOR DEPOSITED COATINGS; VAPOR PRESSURE; X-RAY DIFFRACTION; YTTRIUM; YTTRIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; CHEMICAL COATING; COATINGS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; GRAVIMETRIC ANALYSIS; MAGNETIC RESONANCE; METALS; MICROSCOPY; ORGANIC COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; QUANTITATIVE CHEMICAL ANALYSIS; RESONANCE; SCATTERING; SPECTRA; SPECTROSCOPY; SURFACE COATING; THERMAL ANALYSIS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; YTTRIUM COMPOUNDS
Optional Information
- Secondary number(s)
- CONF-941144--.