Simple model of surface roughness for binary collision sputtering simulations
- 1. Institute of Solid-State Electronics, TU Wien, Floragasse 7, A-1040 Wien (Austria)
- 2. Institute of Physics, Jagiellonian University, ul. Lojasiewicza 11, 30348 Kraków (Poland)
Description
Highlights: • A simple model of surface roughness is proposed. • Its key feature is a linearly varying target density at the surface. • The model can be used in 1D/2D/3D Monte Carlo binary collision simulations. • The model fits well experimental glancing incidence sputtering yield data. - Abstract: It has been shown that surface roughness can strongly influence the sputtering yield – especially at glancing incidence angles where the inclusion of surface roughness leads to an increase in sputtering yields. In this work, we propose a simple one-parameter model (the "density gradient model") which imitates surface roughness effects. In the model, the target's atomic density is assumed to vary linearly between the actual material density and zero. The layer width is the sole model parameter. The model has been implemented in the binary collision simulator IMSIL and has been evaluated against various geometric surface models for 5 keV Ga ions impinging an amorphous Si target. To aid the construction of a realistic rough surface topography, we have performed MD simulations of sequential 5 keV Ga impacts on an initially crystalline Si target. We show that our new model effectively reproduces the sputtering yield, with only minor variations in the energy and angular distributions of sputtered particles. The success of the density gradient model is attributed to a reduction of the reflection coefficient – leading to increased sputtering yields, similar in effect to surface roughness.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2016.09.028Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2016.09.028;
- PII
- S0168-583X(16)30411-6;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 393
- Journal Page Range
- p. 17-21
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 13. conference on computer simulation of radiation effects in solids
- Acronym
- COSIRES 2016
- Dates
- 19-24 Jun 2016
- Place
- Loughborough (United Kingdom)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48071430
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANGULAR DISTRIBUTION; COLLISIONS; COMPUTERIZED SIMULATION; DENSITY; GALLIUM IONS; GEOMETRY; INCIDENCE ANGLE; KEV RANGE 01-10; LAYERS; MOLECULAR DYNAMICS METHOD; MONTE CARLO METHOD; REFLECTION; ROUGHNESS; SIMULATORS; SPUTTERING; SURFACES; WIDTH; YIELDS
- Descriptors DEC
- ANALOG SYSTEMS; CALCULATION METHODS; CHARGED PARTICLES; DIMENSIONS; DISTRIBUTION; ENERGY RANGE; FUNCTIONAL MODELS; IONS; KEV RANGE; MATHEMATICS; PHYSICAL PROPERTIES; SIMULATION; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.