Growth of ReS2 thin films by pulsed laser deposition
Creators
- 1. International Centre for Materials Science, Chemistry and Physics of Materials Unit, Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore 560064 (India)
- 2. School of Advanced Materials, Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore 560064 (India)
- 3. New Chemistry Unit, Jawaharlal Nehru Centre for Advanced Scientific Research, Bangalore 560064 (India)
Description
Highlights: • Large area epitaxial (10 × 10 mm2) growth of ReS2 thin film by PLD • Improved quality ReS2 Thin film on MoS2 template compared to the sapphire substrate • Truncated ReS2 thin films possess optical emission peaks corresponding to both monolayer and multilayer -- Abstract: We present results on growth of ReS2 thin film both on c plane sapphire substrate and MoS2 template by pulsed laser deposition (PLD). Films tend to grow with (0001)ReS2 ⊥ (0001)Al2O3 and (0001)ReS2 ⊥ (0001)MoS2 ∥ (0001)Al2O3 at deposition temperature below 300 °C. Films are polycrystalline grown at temperature above 300 °C. The smoothness and epitaxial quality of the films are significantly improved when grown on MoS2 template compared to sapphire substrate. The results show that PLD is suitable to grow ReS2 thin film over large area (10 × 10 mm2) for practical device application.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2019.06.007Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2019.06.007;
- PII
- S0040609019303761;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 685
- Journal Page Range
- p. 81-87
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55040954
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM OXIDES; EMISSION; ENERGY BEAM DEPOSITION; EPITAXY; LASER RADIATION; MOLYBDENUM; MOLYBDENUM SULFIDES; POLYCRYSTALS; PULSED IRRADIATION; RHENIUM SULFIDES; ROUGHNESS; SAPPHIRE; SUBSTRATES; THIN FILMS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; CORUNDUM; CRYSTAL GROWTH METHODS; CRYSTALS; DEPOSITION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IRRADIATION; METALS; MINERALS; MOLYBDENUM COMPOUNDS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; REFRACTORY METAL COMPOUNDS; REFRACTORY METALS; RHENIUM COMPOUNDS; SULFIDES; SULFUR COMPOUNDS; SURFACE COATING; SURFACE PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.