Published October 2013
| Version v1
Journal article
Compact biaxial micromachined resonant accelerometer
Creators
- 1. Politecnico di Milano, Piazza Leonardo Da Vinci 32, Milano (Italy)
- 2. AMS, STMicroelectronics, Cornaredo (Milano) (Italy)
Description
This paper presents a biaxial silicon resonant microaccelerometer characterized by a high sensitivity and a low cross-axis sensitivity. The device has a detection structure with a single inertial mass and two pairs of resonating beams allowing for the simultaneous differential measurement of acceleration acting along two different axes. The design of the accelerometer and in particular the geometrical configuration of the resonating elements is analytically optimized and finalized through finite element simulations. Experimental results on a fabricated device demonstrate a mean differential sensitivity of 250 Hz g−1 at a polarization voltage of 4 V, around a resonance frequency of 84 kHz. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0960-1317/23/10/105012Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Micromechanics and Microengineering. Structures, Devices and Systems
- Journal Volume
- 23
- Journal Issue
- 10
- Journal Page Range
- [10 p.]
- ISSN
- 0960-1317
- CODEN
- JMMIEZ
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47053864
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S42: ENGINEERING;
- Descriptors DEI
- ACCELERATION; ACCELEROMETERS; BEAMS; COMPUTERIZED SIMULATION; ELECTRIC POTENTIAL; FINITE ELEMENT METHOD; GEOMETRY; KHZ RANGE 01-100; POLARIZATION; SENSITIVITY; SILICON
- Descriptors DEC
- CALCULATION METHODS; ELEMENTS; FREQUENCY RANGE; KHZ RANGE; MATHEMATICAL SOLUTIONS; MATHEMATICS; MEASURING INSTRUMENTS; NUMERICAL SOLUTION; SEMIMETALS; SIMULATION