Cooled silicon crystal monochromator test results
Creators
- 1. Rockwell Power Systems, Albuquerque, NM (United States)
- 2. Stanford Synchrotron Radiation Lab., Menlow Park, CA (United States)
Description
High energy insertion devices, used as x-ray monochromators on synchrotron storage rings, require high performance cooling of the primary optic. Monocrystalline materials, such as silicon, inherently provide crystal lattice properties suitable for x-ray diffraction. Silicon, provides excellent thermal and structural properties as well. Free electron lasers also require high performance heat exchanger technology for mirrors. A highly efficient approach to cooling, called pin post cell, was developed and fully validated in silicon. However, an additional criteria is imposed on the optic when used as a diffractive crystal. The crystalline structure of the material must not be altered during any step of fabrication. A test program has been completed which evaluated the existing fabrication technology for crystal lattice distortion. X-ray diffraction test results are presented. Currently, the authors are fabricating an actively cooled crystal that will undergo dynamic testing on the CHESS F2 beamline later this summer
Additional details
Publishing Information
- Publisher
- SPIE--The International Society for Optical Engineering.
- Imprint Place
- Bellingham, WA (United States)
- ISBN
- 0-8194-0912-X
- Imprint Title
- High heat flux engineering
- Imprint Pagination
- 671 p.
- Journal Page Range
- p. 622-627.
Conference
- Title
- 37. annual Society of Photo-Optical Instrumentation Engineers (SPIE) international symposium on optical and optoelectronic applied science and engineering.
- Dates
- 19-24 Jul 1992.
- Place
- San Diego, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 25006505
- Subject category
- S43: PARTICLE ACCELERATORS; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COOLING; CRYSTAL LATTICES; FABRICATION; FREE ELECTRON LASERS; HEAT EXCHANGERS; LASER MIRRORS; MONOCHROMATORS; MONOCRYSTALS; PERFORMANCE; PERFORMANCE TESTING; SILICON; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; WIGGLER MAGNETS; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- AMPLIFIERS; COHERENT SCATTERING; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; EQUIPMENT; IONIZING RADIATIONS; LASERS; MAGNETS; RADIATION SOURCES; RADIATIONS; SCATTERING; SEMIMETALS; TESTING
Optional Information
- Secondary number(s)
- CONF-920792--.