Published April 1, 2006
| Version v1
Journal article
The ultra-sensitive electrical detection of spin-Rabi oscillation at paramagnetic defects
Creators
- 1. Hahn-Meitner-Institut Berlin, Kekulestrasse 5, 12489 Berlin (Germany)
Description
A short review of the pulsed electrically detected magnetic resonance (pEDMR) experiment is presented. PEDMR allows the highly sensitive observation of coherent electron spin motion of charge carriers and defects in semiconductors by means of transient current measurements. The theoretical foundations, the experimental implementation, its sensitivity and its potential with regard to the investigation of electronic transitions in semiconductors are discussed. For the example of the Pb center at the crystalline silicon (1 1 1) to silicon dioxide interface it is shown experimentally how one can detect spin Rabi-oscillation, its dephasing, coherence decays and spin-coupling effects
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2005.12.231;
- arXiv
- arXiv:quant-ph/0509120v1;
- PII
- S0921-4526(05)01621-2;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 376-377
- Journal Page Range
- p. 930-935
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 23. international conference on defects in semiconductors
- Dates
- 24-29 Jul 2005
- Place
- Awaji Island (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37073280
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE CARRIERS; COUPLING; DECAY; DETECTION; ELECTRONS; INTERFACES; MAGNETIC RESONANCE; OSCILLATIONS; PARAMAGNETISM; SEMICONDUCTOR MATERIALS; SENSITIVITY; SILICON; SILICON OXIDES; SPIN; TRANSIENTS
- Descriptors DEC
- ANGULAR MOMENTUM; CHALCOGENIDES; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; MAGNETISM; MATERIALS; OXIDES; OXYGEN COMPOUNDS; PARTICLE PROPERTIES; RESONANCE; SEMIMETALS; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.