Topological characterization of rearrangements in amorphous solids
- 1. Department of Material Sciences and Engineering, Johns Hopkins University, Baltimore, Maryland 21218, USA
- 2. Department of Mechanical Engineering, Johns Hopkins University, Baltimore, Maryland 21218, USA
- 3. Department of Physics and Astronomy, Johns Hopkins University, Baltimore, Maryland 21218, USA
- 4. Hopkins Extreme Materials Institute, Johns Hopkins University, Baltimore, Maryland 21218, USA
Description
In amorphous materials, plasticity is localized and occurs as shear transformations. It was recently shown by Wu et al. that these shear transformations can be predicted by applying topological defect concepts developed for liquid crystals to an analysis of vibrational eigenmodes [Z. W. Wu et al., Nat. Commun. 14, 2955 (2023)]. This study relates the topological defects to the displacement fields expected of an Eshelby inclusion, which are characterized by an orientation and the magnitude of the eigenstrain. A corresponding orientation and magnitude can be defined for each defect using the local displacement field around each defect. These parameters characterize the plastic stress relaxation associated with the local structural rearrangement and can be extracted using the fit to either the global displacement field or the local field. Both methods provide a reasonable estimation of the molecular-dynamics-measured stress drop, confirming the localized nature of the displacements that control both long-range deformation and stress relaxation.
Additional details
Identifiers
- DOI
- 10.1103/PhysRevE.109.L053002;
- arXiv
- arXiv:2401.07109;
- Crossref Funder ID
- 10.13039/100000001;
Publishing Information
- Journal Title
- Physical Review E
- Journal Volume
- 109
- Journal Issue
- 5
- Journal Page Range
- 6 pgs.
- ISSN
- 1089-3787
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; ATOMIC DISPLACEMENTS; DEFORMATION; INCLUSIONS; LIQUID CRYSTALS; ORIENTATION; PLASTICITY; PLASTICS; POINT DEFECTS; SHEAR; SOLIDS; STRESS RELAXATION; STRESSES; TOPOLOGY; TRANSFORMATIONS; VIBRATIONAL STATES
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; ENERGY LEVELS; EXCITED STATES; FLUIDS; LIQUIDS; MATERIALS; MATHEMATICS; MECHANICAL PROPERTIES; ORGANIC POLYMERS; PETROCHEMICALS; PETROLEUM PRODUCTS; PHYSICAL RADIATION EFFECTS; POLYMERS; RADIATION EFFECTS; RELAXATION; SYNTHETIC MATERIALS
Optional Information
- Copyright
- ©2024 American Physical Society
- Contract/Grant/Project number
- DMREF-2323718/2323719/2323720
- Notes
- Contact Email: paul.desmarchelier@sorbonne-universite.fr; Record automatically processed
- Funding organization
- National Science Foundation