Published April 2008
| Version v1
Journal article
Controlled reduction of size of Ag nanoparticles embedded in teflon matrix by MeV ion irradiation
Creators
- 1. Inter University Accelerator Centre, Post Box -10502, New Delhi 110067 (India)
- 2. Chair for Multicomponent Materials, Institute of Materials Science, Faculty of Engineering, CAU Kiel, Kaiserstr-2, D-24143 Kiel (Germany)
- 3. Department of Physics, Indian Institute of Technology Delhi, New Delhi (India)
Description
MeV ion irradiation of Ag-Teflon nanocomposite (NC) films, which were synthesized by co-sputtering, was studied in this work. Irradiation of these NC thin films with 100 MeV Ag8+ ions at fluences from 3 x 1011 to 1 x 1012 ions/cm2 resulted in the reduction of size of Ag NPs as evident by the increase in width of plasmon absorption band and red shift in plasmon absorption peak. TEM results confirmed the decrease in size of NPs by the changes evident from the particle size distribution, which emphasize the role of ion beams in nano-engineering. This article reports the possibility of reduction in size and size distribution in controlled fashion by swift heavy ion irradiation
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2008.01.040Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2008.01.040;
- PII
- S0168-583X(08)00074-8;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 266
- Journal Issue
- 8
- Journal Page Range
- p. 1804-1809
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 18. international conference on ion beam analysis
- Dates
- 23-28 Sep 2007
- Place
- Hyderabad (India)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40013489
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; COMPOSITE MATERIALS; HEAVY IONS; ION BEAMS; IRRADIATION; MEV RANGE; NANOSTRUCTURES; PARTICLE SIZE; TEFLON; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELECTRON MICROSCOPY; ENERGY RANGE; FILMS; FLUORINATED ALIPHATIC HYDROCARBONS; HALOGENATED ALIPHATIC HYDROCARBONS; IONS; MATERIALS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC FLUORINE COMPOUNDS; ORGANIC HALOGEN COMPOUNDS; ORGANIC POLYMERS; PETROCHEMICALS; PETROLEUM PRODUCTS; PLASTICS; POLYETHYLENES; POLYMERS; POLYOLEFINS; POLYTETRAFLUOROETHYLENE; SIZE; SORPTION; SYNTHETIC MATERIALS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.