Published April 2008 | Version v1
Journal article

Controlled reduction of size of Ag nanoparticles embedded in teflon matrix by MeV ion irradiation

  • 1. Inter University Accelerator Centre, Post Box -10502, New Delhi 110067 (India)
  • 2. Chair for Multicomponent Materials, Institute of Materials Science, Faculty of Engineering, CAU Kiel, Kaiserstr-2, D-24143 Kiel (Germany)
  • 3. Department of Physics, Indian Institute of Technology Delhi, New Delhi (India)

Description

MeV ion irradiation of Ag-Teflon nanocomposite (NC) films, which were synthesized by co-sputtering, was studied in this work. Irradiation of these NC thin films with 100 MeV Ag8+ ions at fluences from 3 x 1011 to 1 x 1012 ions/cm2 resulted in the reduction of size of Ag NPs as evident by the increase in width of plasmon absorption band and red shift in plasmon absorption peak. TEM results confirmed the decrease in size of NPs by the changes evident from the particle size distribution, which emphasize the role of ion beams in nano-engineering. This article reports the possibility of reduction in size and size distribution in controlled fashion by swift heavy ion irradiation

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2008.01.040

Additional details

Identifiers

DOI
10.1016/j.nimb.2008.01.040;
PII
S0168-583X(08)00074-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
266
Journal Issue
8
Journal Page Range
p. 1804-1809
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
18. international conference on ion beam analysis
Dates
23-28 Sep 2007
Place
Hyderabad (India)

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.