Published May 1986
| Version v1
Journal article
Performance of parallel-plate electron spectrometer with position-sensitive detector
Description
A new electron spectrometer system consisting of a parallel-plate energy analyzer combined with a position-sensitive detector assembly has been developed. The performance of the new system was studied, and the system was found to give an efficiency two orders of magnitude greater than that of conventional spectrometers. The new system was attached to a beam line at the Photon Factory at Tsukuba and was used to measure the degree of polarization of monochromatized synchrotron radiation. (author)
Additional details
Publishing Information
- Journal Title
- Jpn. J. Appl. Phys., Part 1
- Journal Volume
- 25
- Journal Issue
- 5
- Series
- Jpn. J. Appl. Phys., Part 1.
- Journal Page Range
- 657-660
- ISSN
- 0021-4922
- CODEN
- JAPND
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 18042642
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- EFFICIENCY; ELECTRON SPECTROMETERS; KEK PHOTON FACTORY; MICROCHANNEL ELECTRON MULTIPLI; PERFORMANCE; PHOTOELECTRIC EMISSION; POLARIZATION; POSITION SENSITIVE DETECTORS; SYNCHROTRON RADIATION
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELECTRON EMISSION; ELECTRON MULTIPLIERS; ELECTRON TUBES; EMISSION; MEASURING INSTRUMENTS; PHOTOELECTRIC EFFECT; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; SPECTROMETERS; SYNCHROTRON RADIATION SOURCES