Published September 2, 1999 | Version v1
Journal article Metadata-only

A method for constructing multi-layered thickness profiles from micro-PIXE line-scans

Creators

Description

A method of converting the lateral X-ray yield intensity distributions from micro-PIXE line-scans into multi-layered thickness profiles is proposed. The method is demonstrated by the construction of multi-layered wear patterns of the flank faces of two types of TiN-coated high-speed steel (HSS) drills used in machining stainless steel workpieces. The wear features consist of three layers, namely the tool substrate, the TiN-coating and the adhered workpiece material. Differences in the wear patterns of the drills were identified from the obtained multi-layered thickness profiles

Additional details

Identifiers

PII
S0168583X99005303;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
158
Journal Issue
1-4
Journal Page Range
p. 729-735
ISSN
0168-583X
CODEN
NIMBEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
33044797
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COATINGS; DRILLS; LAYERS; NUCLEAR REACTION YIELD; PIXE ANALYSIS; THIN FILMS; TITANIUM NITRIDES; X-RAY EMISSION ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; DRILLING EQUIPMENT; EQUIPMENT; FILMS; NITRIDES; NITROGEN COMPOUNDS; NONDESTRUCTIVE ANALYSIS; PNICTIDES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; X-RAY EMISSION ANALYSIS; YIELDS

Optional Information

Copyright
Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.