Published March 1, 2009
| Version v1
Journal article
Thickness dependence of the superconductivity in thin disordered NbSi films
- 1. C.S.N.S.M, CNRS-IN2P3, UMR 8609, Paris XI University, Orsay (France)
Description
Superconducting a-NbxSi1-x thin films experience a lowering of the Tc until the superconductivity disappears through a Superconductor-Insulator Transition (SIT). We here present transport measurements on 2D a-NbxSi1-x films, close to the SIT, for different compositions and thicknesses. We investigate the lowering of the Tc in light of existing theories, especially the one developed by Finkel'stein.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/150/4/042019Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 150
- Journal Issue
- 4
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 25. international conference on low temperature physics
- Acronym
- LT25
- Dates
- 6-13 Aug 2008
- Place
- Amsterdam (Netherlands)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41110158
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CONCENTRATION RATIO; ELECTRICAL INSULATORS; NIOBIUM SILICIDES; PHASE TRANSFORMATIONS; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; SUPERCONDUCTORS; TEMPERATURE DEPENDENCE; THICKNESS; THIN FILMS; TRANSITION TEMPERATURE
- Descriptors DEC
- DIMENSIONLESS NUMBERS; DIMENSIONS; ELECTRIC CONDUCTIVITY; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; FILMS; NIOBIUM COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SILICIDES; SILICON COMPOUNDS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS