Published March 1, 1999 | Version v1
Journal article Metadata-only

Measurement of total atomic attenuation, total atomic photoelectric and total atomic scattering cross sections in the range 40 ≤ 3D Z ≤ 3D 52

Creators

  • 1. Department of Physics, Faculty of Arts and Sciences, Atatuerk University, 25240 Erzurum (Turkey)
  • 2. Department of Physics, Faculty of Kazim Karabekir Education, Atatuerk University, 25240 Erzurum (Turkey)

Description

Total atomic attenuation, total atomic photoelectric and total atomic scattering cross sections by measuring the transmission factor has been fairly accurately calculated. K X-ray fluorescence (XRF) spectra were measured for Zr, Nb, Mo, Ag, In, Sn and Te at excitation energy of 59.537 keV using Si (Li) detector coupled to a model computerised multi-channel analyser in a 2π geometry set-up. These measured cross sections were compared with the corresponding theoretical and good agreement was observed between the experimental and theoretical values. (Copyright (c) 1999 Elsevier Science B.V., Amsterdam. All rights reserved.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
149
Journal Issue
4
Journal Page Range
p. 379-382
ISSN
0168-583X
CODEN
NIMBEU

INIS

Country of Publication
Netherlands
Country of Input or Organization
Belarus
INIS RN
31064270
Subject category
S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
Descriptors DEI
ATTENUATION; GOLD; INDIUM; LI-DRIFTED SI DETECTORS; MOLYBDENUM; NIOBIUM; PHYSICAL RADIATION EFFECTS; TELLURIUM; TIN; TOTAL CROSS SECTIONS; X-RAY FLUORESCENCE ANALYSIS; ZIRCONIUM
Descriptors DEC
ALLOYS; CHEMICAL ANALYSIS; CROSS SECTIONS; ELEMENTS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; RADIATION EFFECTS; REFRACTORY METALS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SI SEMICONDUCTOR DETECTORS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS