Determination of effective atomic number of composite materials using backscattered gamma photons – A novel method
Creators
- 1. Department of Studies in Physics, Karnatak University, Dharwad, 580003 (India)
Description
Highlights: • Authors measured the backscattered photons to determine Zeff of composite samples. • Backscattered photons generated by 661.6 keV photons from weak Cs-137 gamma source. • Ratio of thickness to intensity of backscattered saturated peak used to infer Zeff. • Present experimental technique is used to determine Zeff ≤ 30 of composite sample. • Method can be used to determine the Zeff of biological samples using weak source. The effective atomic number (Zeff) of composite materials has been determined by measuring the backscattered gamma photons at 180°. A 661.6 keV gamma photons from 137Cs radioactive source are allowed to scatter at an angle of 180° from the sample. The backscattered photons at 180° from the sample are detected with "2 × 2″ NaI(Tl) scintillation gamma ray spectrometer coupled to 16 K Multi Channel Analyzer (MCA). It is observed experimentally that the intensity of backscattered photons increases initially with increasing the thickness of the target and then it becomes saturated above a certain thickness. By knowing the saturated thickness values for known atomic number of the elemental targets, the Zeff of composite materials has been determined. The experimentally measured Zeff values have been compared with theoretical values predicted by direct method, power law method and AutoZeff code.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.cplett.2018.02.012Additional details
Identifiers
- DOI
- 10.1016/j.cplett.2018.02.012;
- PII
- S0009261418300964;
Publishing Information
- Journal Title
- Chemical Physics Letters
- Journal Volume
- 695
- Journal Page Range
- p. 94-98
- ISSN
- 0009-2614
- CODEN
- CHPLBC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54069346
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ATOMIC NUMBER; CESIUM 137; COMPOSITE MATERIALS; GAMMA SOURCES; GAMMA SPECTROMETERS; KEV RANGE; MULTI-CHANNEL ANALYZERS; PHOTONS; SCINTILLATIONS; THICKNESS
- Descriptors DEC
- BETA DECAY RADIOISOTOPES; BETA-MINUS DECAY RADIOISOTOPES; BOSONS; CESIUM ISOTOPES; DIMENSIONS; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; ENERGY RANGE; EQUIPMENT; INTERMEDIATE MASS NUCLEI; ISOTOPES; MASSLESS PARTICLES; MATERIALS; MEASURING INSTRUMENTS; NUCLEI; ODD-EVEN NUCLEI; PULSE ANALYZERS; RADIATION SOURCES; RADIOISOTOPES; SPECTROMETERS; YEARS LIVING RADIOISOTOPES
Optional Information
- Copyright
- Copyright (c) 2018 Published by Elsevier B.V.