Published November 1999 | Version v1
Journal article Metadata-only

Nondestructive X-ray fluorescence analysis of soils, silts, river and bottom sediments

Creators

  • 1. SO RAN, Inst. Geokhimii im. A.P. Vinogradova, Irkutsk (Russian Federation)

Description

A procedure has been developed for the nondestructive X-ray fluorescence determination of major and some trace elements (Na, K, Mg, Ca, Sr, Al, Si, P, S, Ti, Mn, Fe, Zr) in soils, sediments and loose deposits. The procedure requires no pretreatment of a sample, except for its drying at 105 Deg C. The reasons why the media under consideration cannot be homogenized by fusion are discussed. The procedure of matrix correction is based in the α-coefficients calculated for homogeneous materials. The results obtained by X-ray fluorescence analysis are in reasonable agreement with certified values

Abstract (Russian)

Для анализа почв, осадков и рыхлых отложений разработана методика недеструктивного рентгенофлуоресцентного анализа основных и некоторых микроэлементов (Na, K, Mg, Ca, Sr, Al, Si, P, S, Ti, Mn, Fe, Zr), не требующая предварительной обработки образца, за исключением просушивания его при 105 град С. Обсуждается, почему рассматриваемые среды нельзя гомогенизировать сплавлением. Процедура матричной коррекции основана на α-коэффициентах, рассчитанных для гомогенных материалов. Согласие между результатами РФА и аттестованными величинами удовлетворительное

Additional details

Additional titles

Original title (Russian)
Неразрушающий рентгенофлуоресцентный анализ почв, илов, речных и донных осадков

Publishing Information

Journal Title
Zhurnal Analiticheskoj Khimii
Journal Volume
54
Journal Issue
11
Journal Page Range
p. 1222-1227
ISSN
0044-4502
CODEN
ZAKHA8

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
32002334
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
ACCURACY; ALKALI METAL COMPOUNDS; ALKALINE EARTH METAL COMPOUNDS; ALUMINIUM COMPOUNDS; DRYING; PHOSPHORUS COMPOUNDS; QUANTITATIVE CHEMICAL ANALYSIS; SAMPLE PREPARATION; SEDIMENTS; SENSITIVITY; SILICON COMPOUNDS; SILT; SOILS; SULFUR COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS

Optional Information

Notes
28 refs., 1 fig., 4 tabs.