Determination of changes in refractive index and thickness of SiO2 thin film on polycarbonate created by Vis-IR laser irradiation

Complete text of publication follows. The effect of Vis-IR laser irradiation at various energy densities on refractive index and thickness of SiO2 thin film onto polycarbonate was reported in this paper. Transmittance spectra were used for determination the above characteristics of these films by application of analytical formulas was to the interference extrema. (Swanepoel method). It has been found that the thickness of films decrease by increasing the photon energy of laser and its energy density. It has been observed that the transmittance decreases with the increase of film thickness. From transmittance data, the dispersion of refractive index of sample has been studied. It was found that at high energy density (50 .35 J/cm2), the refractive index of sample was more increased. The highest increased in refractive index (Δn ∼ 0.1) was found for sample which irradiated by 532 nm laser beam with 50.35 J/cm2 energy density.