Published July 2010 | Version v1
Journal article

Application of digital holography to filament size analysis

  • 1. Laboratory for Aero and Hydrodynamics, Faculty of Mechanical, Maritime and Materials Engineering, Department of Process and Energy, Delft University of Technology, Leeghwaterstraat 21, 2628 CA Delft (Netherlands)
  • 2. Teijin Aramid, Arnhem (Netherlands)

Description

The potential of in-line digital holography to locate and measure the size and position of filaments, i.e. thin wire-like objects, distributed throughout a thick volume has been investigated. In this paper two approaches are introduced to study filaments of varying diameter. (1) It is shown analytically and experimentally that for a gradual variation of filament diameter, one-dimensional Fraunhofer diffraction theory can be applied with an accuracy of 5% to filaments with a diameter of 60–100 µm; the x and z positions of filaments in a bundle can be determined with 0.1 mm and 0.3 mm accuracy respectively. (2) The out-of-focus plane approach has been modified and applied to a simple bundle of filaments for the case when their diffraction patterns can no longer be distinguished individually on the hologram. An accuracy of 20% in measuring diameter and 0.3 mm to detect the position is reported. Limitations as well as suggestions to further improve the technique are discussed

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/21/7/075301

Additional details

Identifiers

DOI
10.1088/0957-0233/21/7/075301;
PII
S0957-0233(10)30258-X;

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
21
Journal Issue
7
Journal Page Range
[9 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45007643
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ACCURACY; DIFFRACTION; FILAMENTS; HOLOGRAPHY; MEASURING INSTRUMENTS; MEASURING METHODS; WIRES
Descriptors DEC
COHERENT SCATTERING; SCATTERING