Size dependent strengthening in high strength nanotwinned Al/Ti multilayers
Creators
- 1. School of Materials Engineering, Purdue University, West Lafayette, IN, 47907 (United States)
- 2. School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, 47907 (United States)
Description
Mechanical behavior of metallic multilayers has been intensively investigated. Here we report on the study of magnetron-sputtered highly textured Al/Ti multilayer films with various individual layer thicknesses (h = 1–90 nm). The hardness of Al/Ti multilayers increases monotonically with decreasing layer thickness without softening and exceeds 7 GPa, making it one of the strongest light-weight multilayer systems reported to date. High-resolution transmission electron microscopy and X-ray diffraction pole figure analyses confirm the formation of high-density nanotwins and 9R phases in Al layers. The density of nanotwins and stacking faults scales inversely with individual layer thickness. In addition, there is an HCP-to-FCC phase transformation of Ti when h ≤ 4.5 nm. The high strength of Al/Ti multilayers primarily originates from incoherent layer interfaces, high-density twin boundaries, as well as stacking faults.
Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2019.06.028;
- PII
- S1359645419303957;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 175
- Journal Page Range
- p. 466-476
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55030723
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- FCC LATTICES; HARDNESS; HCP LATTICES; MAGNETRONS; PHASE TRANSFORMATIONS; STACKING FAULTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; FILMS; HEXAGONAL LATTICES; MECHANICAL PROPERTIES; MICROSCOPY; MICROWAVE EQUIPMENT; MICROWAVE TUBES; SCATTERING; THREE-DIMENSIONAL LATTICES
Optional Information
- Notes
- Published by Elsevier Ltd on behalf of Acta Materialia Inc.