Published November 1, 2003 | Version v1
Journal article

Magnetron sputtered W-C films with C60 as carbon source

Description

Thin films in the W-C system were prepared by magnetron sputtering of W with coevaporated C60 as carbon source. Epitaxial deposition of different W-C phases is demonstrated. In addition, nanocrystalline tungsten carbide film growth is also observed. At low C60/W ratios, epitaxial growth of α-W with a solid solution of carbon was obtained on MgO(001) and Al2O3(001) at 400 deg. C. The carbon content in these films (10-20 at.%) was at least an order of magnitude higher than the maximum equilibrium solubility and gives rise to an extreme hardening effect. Nanoindentation measurements showed that the hardness of these films increased with the carbon content and values as high as 35 GPa were observed. At high C60/W ratios, films of the cubic β-WC1-x (x=0-0.6) phase were deposited with a nanocrystalline microstructure. Films with a grain size <30 A were obtained and the hardness of these films varied from 14 to 24 GPa. At intermediate C60/W ratios, epitaxial films of hexagonal W2C were deposited on MgO(111) at 400 deg. C. Polycrystalline phase mixtures were obtained on other substrates and hexagonal WC could be deposited as minority phase at 800 deg. C

Additional details

Identifiers

DOI
10.1016/S0040-6090;
PII
S0040609003009374;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
444
Journal Issue
1-2
Journal Page Range
p. 29-37
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.