Quantitative analysis of rutile in cosmetic foundation by powder X-ray diffractometry/Rietveld refinement
- 1. Meiji University, Graduate School of Science and Technology, Applied Chemistry Course, Kawasaki, Kanagawa (Japan)
- 2. Rigaku Corporation, Product Division, Akishima, Tokyo (Japan)
- 3. Meiji University, School of Science and Technology, Department of Applied Chemistry, Kawasaki, Kanagawa (Japan)
Description
Quantitative analysis of crystalline phases in cosmetic foundation was investigated by powder X-ray diffractometry/Rietveld refinement which is a non-destructive and standardless quantitative analysis method. Quantitativity of Rietveld refinement has been evaluated using rutile which was only crystalline phase containing titanium in cosmetic foundation sample. The analytical result of Rietveld refinement was verified by comparing with the quantitative values of titanium dioxide or rutile calculated from the fundamental parameter method by X-ray fluorescence spectrometry and the calibration curve method with sylvite as an internal standard by X-ray diffractometry. Quantitative value of titanium dioxide by X-ray fluorescence analysis and rutile by calibration curve method was 10.6 mass% and 12.0 mass%, respectively. Quantitative value of 11.8 mass% for rutile obtained by Rietveld refinement showed in good agreement with those values obtained by X-ray fluorescence spectrometry and the calibration curve method. Thus, the quantitativity of rutile by Rietveld refinement was effective for quantitative analysis of crystalline phase. (author)
Abstract (Japanese)
化粧用ファンデー ションを分析対象とし,試料中に含まれる全ての結晶相を前処埋不要かつスタンダードレスな定量分析法である粉末X線回折 / Rietveld 解析により定量値を算出し,その値を正確に評価するための検討を行った.定性分析の結果,チタンを含む化合物はルチルのみであったため,二酸化チタンを一つの指標として分析結果を評価した.化粧用ファンデーションに対して,蛍光X線分析法のファンダメンタルパラメータ法による二酸化チタンとX線回折法の内部標準物質を用いた検量線法によるルチルの定量値をRietveld解析結果と比較することで,Rietveld解析の定量値を検証した.Rietveld解析によるルチルの定量値は11.8mass%,検量線法によるルチルの定量値は12.0mass%,蛍光X線分析法による二酸化チタンの定量値は10.6mass%となり,それぞれの定量値はおおむね一致した.これより,Rietveld解析によるルチルの定量性を評価することが可能であった.(著者)Additional details
Additional titles
- Original title (Japanese)
- 粉末X線回折法/Rietveld解析による化粧用ファンデーション中ルチルの定量分析
- Augmented title (English)
- (free terms) X-ray diffractometry; Rietveld refinement; X-ray fluorescence spectrometry; Cosmetic foundation; Titanium dioxide
Publishing Information
- Journal Title
- X-sen Bunseki No Shinpo
- Journal Volume
- 55
- Series
- 雑誌名:X線分析の進歩
- Journal Page Range
- p. 115-126
- ISSN
- 0911-7806
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 55081298
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CALIBRATION; CONSUMER PRODUCTS; CRYSTAL STRUCTURE; POWDERS; RUTILE; TITANIUM OXIDES; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTRA
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; MATERIALS; MINERALS; NONDESTRUCTIVE ANALYSIS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; RADIOACTIVE MATERIALS; RADIOACTIVE MINERALS; SCATTERING; SPECTRA; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 30 refs., 4 figs., 4 tabs.