Published January 1, 2018 | Version v1
Journal article

Traceable calibration for a digital real-time oscilloscope with time interleaving architecture

  • 1. Center for Electromagnetic Metrology, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu, Daejeon (Korea, Republic of)

Description

Impairments of analog-to-digital converters (ADCs) used in digital real-time oscilloscopes (DRTO) have caused inevitable signal distortions in measurements. To calibrate these errors with traceability, we propose a novel method that consists of two steps. First, each transfer function of the ADCs is measured using pulse trains from a photodiode calibrated up to 110 GHz. Each data set of the ADCs is superimposed to convert the repetitive pulse to a single pulse to solve the under-sampling problem of the separated data depending on each ADC. Then, the signals of the device under test (DUT) are also separated and superimposed depending on the ADCs, and they are calibrated in the frequency domain based on the measured transfer functions. After a calibration process, the data set is reconverted to the time domain to achieve traceable calibration. To verify our method, we have measured the output of another 70 GHz photodiode with a calibrated DRTO. In terms of results, time-interleaved errors are suppressed by more than 24 dB up to the bandwidth of the DRTO. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1361-6501/aa892c

Additional details

Identifiers

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
29
Journal Issue
1
Journal Page Range
[6 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
51043182
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ANALOG-TO-DIGITAL CONVERTERS; CALIBRATION; ERRORS; GHZ RANGE 01-100; PHOTODIODES; PULSES; SAMPLING; SIGNAL DISTORTION; TRANSFER FUNCTIONS
Descriptors DEC
ELECTRONIC EQUIPMENT; EQUIPMENT; FREQUENCY RANGE; FUNCTIONS; GHZ RANGE; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES