Traceable calibration for a digital real-time oscilloscope with time interleaving architecture
- 1. Center for Electromagnetic Metrology, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong-gu, Daejeon (Korea, Republic of)
Description
Impairments of analog-to-digital converters (ADCs) used in digital real-time oscilloscopes (DRTO) have caused inevitable signal distortions in measurements. To calibrate these errors with traceability, we propose a novel method that consists of two steps. First, each transfer function of the ADCs is measured using pulse trains from a photodiode calibrated up to 110 GHz. Each data set of the ADCs is superimposed to convert the repetitive pulse to a single pulse to solve the under-sampling problem of the separated data depending on each ADC. Then, the signals of the device under test (DUT) are also separated and superimposed depending on the ADCs, and they are calibrated in the frequency domain based on the measured transfer functions. After a calibration process, the data set is reconverted to the time domain to achieve traceable calibration. To verify our method, we have measured the output of another 70 GHz photodiode with a calibrated DRTO. In terms of results, time-interleaved errors are suppressed by more than 24 dB up to the bandwidth of the DRTO. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6501/aa892cAdditional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 29
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51043182
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANALOG-TO-DIGITAL CONVERTERS; CALIBRATION; ERRORS; GHZ RANGE 01-100; PHOTODIODES; PULSES; SAMPLING; SIGNAL DISTORTION; TRANSFER FUNCTIONS
- Descriptors DEC
- ELECTRONIC EQUIPMENT; EQUIPMENT; FREQUENCY RANGE; FUNCTIONS; GHZ RANGE; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES