Effect of different atmospheres on the electrical contact performance of electronic components under fretting wear
- 1. Tribology Research Institute, Traction Powder State Key Laboratory Southwest Jiaotong University, Chengdu 610031 (China)
Description
The effects of oxide etch on the surface morphology of metals for industrial application is a common cause of electrical contacts failure, and it has becomes a more severe problem with the miniaturization of modern electronic devices. This study investigated the effects of electrical contact resistance on the contactor under three different atmospheres (oxygen, air, and nitrogen) based on 99.9% copper/pogo pins contacts through fretting experiments. The results showed the minimum and stable electrical contact resistance value when shrouded in the nitrogen environment and with high friction coefficient. The rich oxygen environment promotes the formation of cuprous oxide, thereby the electrical contact resistance increases. Scanning electron microscope microscopy and electron probe microanalysis were used to analyze the morphology and distribution of elements of the wear area, respectively. The surface product between contacts was investigated by x-ray photoelectron spectroscopy analysis to explain the different electrical contact properties of the three tested samples during fretting. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6463/aab30dAdditional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 51
- Journal Issue
- 15
- Journal Page Range
- [12 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53008018
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- COPPER; COPPER OXIDES; ELECTRIC CONTACTS; ELECTRON MICROPROBE ANALYSIS; ELECTRONIC EQUIPMENT; FRICTION FACTOR; MINIATURIZATION; MORPHOLOGY; NITROGEN; OXYGEN; PERFORMANCE; SCANNING ELECTRON MICROSCOPY; SHROUDS; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; COOLING SYSTEMS; COPPER COMPOUNDS; DIMENSIONLESS NUMBERS; ELECTRICAL EQUIPMENT; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; ENERGY SYSTEMS; EQUIPMENT; METALS; MICROANALYSIS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; REACTOR COMPONENTS; REACTOR COOLING SYSTEMS; SPECTROSCOPY; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS