Published November 2006 | Version v1
Journal article

SAXES, a high resolution spectrometer for resonant x-ray emission in the 400-1600 eV energy range

  • 1. Institut de Physique des Nanostructures, Ecole Polytechnique Fedederale de Lausanne, CH-1015 Lausanne (Switzerland)
  • 2. Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland)
  • 3. Dipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, I-20133 Milan (Italy)

Description

We present a 5 m long spectrometer for soft x rays to be used at a synchrotron radiation beamline for resonant x-ray emission spectroscopy and resonant inelastic x-ray scattering in the 400-1600 eV energy range. It is based on a variable line spacing spherical grating (average groove density of 3200 mm-1, R=58.55 m) and a charge coupled device two dimensional detector. With an x-ray spot on the sample of 10 μm, the targeted resolving power is higher than 10 000 at all energies below 1100 eV and better than 7000 at 1500 eV. The off-line tests made with Al and Mg Kα1,2 fluorescence emissions indicate that the spectrometer can actually work at 12 000 and 17 000 resolving power at the L3 edges of Cu (930 eV) and of Ti (470 eV), respectively. SAXES (superadvanced x-ray emission spectrometer) is mounted on a rotating platform allowing to vary the scattering angle from 25 degree sign to 130 degree sign . The spectrometer will be operational at the ADRESS (advanced resonant spectroscopies) beamline of the Swiss Light Source from 2007

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
77
Journal Issue
11
Journal Page Range
p. 113108-113108.9
ISSN
0034-6748
CODEN
RSINAK

Optional Information

Notes
(c) 2006 American Institute of Physics