Published 1978 | Version v1
Journal article Metadata-only

Quantitative intensity scanning in the transmission electron microscope

Creators

  • 1. Instituto Militar de Engenharia, Rio de Janeiro (Brazil)
  • 2. Florida Univ., Gainesville (USA). Dept. of Metalurgical and Materials Engineering

Description

A simple system to scan a transmission elctron microscope image and record its intensity profile is described, using a channeltron electron multiplier as its basic component. It allows observation of image detail during scanning, and does not interfere with normal microscope operation . The performance of the system is evaluated, and its advantages and limitations are discussed

Additional details

Publishing Information

Journal Title
Rev. Bras. Tecnol.
Journal Volume
6
Series
Rev. Bras. Tecnol.
Journal Page Range
195-200
ISSN
0370-3835

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
10430919
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Thesis
Descriptors DEI
ACCURACY; ELECTRON CHANNELING; ELECTRON MICROSCOPES; ELECTRON MULTIPLIERS; ELECTRON SCANNING; IMAGE INTENSIFIERS; IMAGE SCANNERS; MEASURING METHODS; PERFORMANCE
Descriptors DEC
CHANNELING; ELECTRON TUBES; MICROSCOPES