Published November 2012 | Version v1
Journal article

Fabrication of SiC nanowire thin-film transistors using dielectrophoresis

  • 1. Key Laboratory for Thin Film and Microfabrication of the Ministry of Education, Research Institute of Micro and Nano Science and Technology, Shanghai Jiao Tong University, Shanghai 200240 (China)

Description

The selection of solvents for SiC nanowires (NWs) in a dielectrophoretic process is discussed theoretically and experimentally. From the viewpoints of dielectrophoresis force and torque, volatility, as well as toxicity, isopropanol (IPA) is considered as a proper candidate. By using the dielectrophoretic process, SiC NWs are aligned and NW thin films are prepared. The densities of the aligned SiC NWs are 2 μm−1, 4 μm−1, 6 μm−1, which corresponds to SiC NW concentrations of 0.1 μg/μL, 0.3 μg/μL and 0.5 μg/μL, respectively. Thin-film transistors are fabricated based on the aligned SiC NWs of 6 μm−1. The mobility of a typical device is estimated to be 13.4 cm2/(V·s). (semiconductor devices)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/33/11/114001

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
33
Journal Issue
11
Journal Page Range
[6 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44043093
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
FABRICATION; PROPANOLS; QUANTUM WIRES; SILICON CARBIDES; SOLVENTS; THIN FILMS; TORQUE; TOXICITY; TRANSISTORS; VOLATILITY
Descriptors DEC
ALCOHOLS; CARBIDES; CARBON COMPOUNDS; FILMS; HYDROXY COMPOUNDS; NANOSTRUCTURES; ORGANIC COMPOUNDS; SEMICONDUCTOR DEVICES; SILICON COMPOUNDS