Published May 1, 2010 | Version v1
Journal article

High-reflectivity (m=4) elliptical neutron focusing supermirror fabricated by numerically controlled local wet etching with ion beam sputter deposition

  • 1. Research Center for Ultra-precision Science and Technology, Graduate School of Engineering, Osaka University, Yamadaoka 2-1, Suita, Osaka 565-0871 (Japan)
  • 2. J-PARC Center, Japan Atomic Energy Agency, Tokai-mura, Ibaraki (Japan)

Description

High-performance neutron-focusing supermirror devices with both high figure accuracy and high reflectivity are essential to effectively collect and focus a neutron beam on a sample without scattering loss. To fabricate these devices, numerically controlled local wet etching and ion beam sputter deposition techniques were developed for the figuring of an aspherical mirror substrate and for the deposition of NiC/Ti multilayers, respectively. By applying these techniques, a plano-elliptical supermirror with a clear aperture size of 90 mmx40 mm was fabricated to focus a cold neutron beam. Focusing performance and reflectivity were evaluated using a neutron reflectometer and a focusing gain of 4.4 and a reflectivity of 0.64-0.7 in the near-critical-angle region for m=4 were achieved.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2009.11.070

Additional details

Identifiers

DOI
10.1016/j.nima.2009.11.070;
PII
S0168-9002(09)02285-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
616
Journal Issue
2-3
Journal Page Range
p. 193-196
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
International workshop on X-ray mirror design, fabrication and metrology (IWXM)
Dates
22-24 Sep 2009
Place
Osaka (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41077839
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; APERTURES; COLD NEUTRONS; DEPOSITION; EQUIPMENT; ETCHING; FOCUSING; GAIN; ION BEAMS; MIRRORS; NEUTRON BEAMS; PERFORMANCE; REFLECTIVITY; SPUTTERING
Descriptors DEC
AMPLIFICATION; BARYONS; BEAMS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; NEUTRONS; NUCLEON BEAMS; NUCLEONS; OPENINGS; OPTICAL PROPERTIES; PARTICLE BEAMS; PHYSICAL PROPERTIES; SURFACE FINISHING; SURFACE PROPERTIES

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.