High-reflectivity (m=4) elliptical neutron focusing supermirror fabricated by numerically controlled local wet etching with ion beam sputter deposition
- 1. Research Center for Ultra-precision Science and Technology, Graduate School of Engineering, Osaka University, Yamadaoka 2-1, Suita, Osaka 565-0871 (Japan)
- 2. J-PARC Center, Japan Atomic Energy Agency, Tokai-mura, Ibaraki (Japan)
Description
High-performance neutron-focusing supermirror devices with both high figure accuracy and high reflectivity are essential to effectively collect and focus a neutron beam on a sample without scattering loss. To fabricate these devices, numerically controlled local wet etching and ion beam sputter deposition techniques were developed for the figuring of an aspherical mirror substrate and for the deposition of NiC/Ti multilayers, respectively. By applying these techniques, a plano-elliptical supermirror with a clear aperture size of 90 mmx40 mm was fabricated to focus a cold neutron beam. Focusing performance and reflectivity were evaluated using a neutron reflectometer and a focusing gain of 4.4 and a reflectivity of 0.64-0.7 in the near-critical-angle region for m=4 were achieved.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2009.11.070Additional details
Identifiers
- DOI
- 10.1016/j.nima.2009.11.070;
- PII
- S0168-9002(09)02285-2;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 616
- Journal Issue
- 2-3
- Journal Page Range
- p. 193-196
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- International workshop on X-ray mirror design, fabrication and metrology (IWXM)
- Dates
- 22-24 Sep 2009
- Place
- Osaka (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41077839
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; APERTURES; COLD NEUTRONS; DEPOSITION; EQUIPMENT; ETCHING; FOCUSING; GAIN; ION BEAMS; MIRRORS; NEUTRON BEAMS; PERFORMANCE; REFLECTIVITY; SPUTTERING
- Descriptors DEC
- AMPLIFICATION; BARYONS; BEAMS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; NEUTRONS; NUCLEON BEAMS; NUCLEONS; OPENINGS; OPTICAL PROPERTIES; PARTICLE BEAMS; PHYSICAL PROPERTIES; SURFACE FINISHING; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.