Published April 15, 2001 | Version v1
Journal article

Specimen preparation in PIXE analysis

  • 1. Guelph Univ., Ontario (Canada). Dept. of Physics

Description

A review is presented of target backings and specimen preparation techniques for proton-induced X-ray emission analysis. The main emphasis is on techniques that afford the optimum detection limits in trace metal analysis of biological specimens. (Auth.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods
Journal Volume
142
Journal Issue
1-2
Series
Nucl. Instrum. Methods.
Journal Page Range
263-273

Conference

Title
International conference on particle induced X-ray emission and its analytical applications.
Dates
23 - 26 Aug 1976.
Place
Lund, Sweden.