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Published April 2019 | Version v1
Journal article

Phenomenological modelling of light transmission through nanowires arrays

  • 1. Lumière, nanomatéraux, nanotechnologie (L2n), Institut Charles Delaunay, CNRS FRE 2019, Université de Technologie de Troyes, 12 rue Marie Curie, CS 42060, 10004 Troyes Cedex (France)
  • 2. Chimie Paristech, PSL Research University, CNRS, Institut de Recherche de Chimie Paris (IRCP), 11 rue Pierre et Marie Curie, 75005 Paris (France)

Description

Highlights: • Simulation of light transmission through randomly distributed nanowires arrays. • Mie contribution is accounted for the extinction coefficient of the thin film. • Retrieved parameters are comparable to the real geometry. -- Abstract: A phenomenological model has been developed and discussed. The model is able to describe the experimentally measured light transmission of nanowires arrays. Two representative samples were studied in this report. A well aligned nanowires sample was first modelled by an effective layer model with surface roughness added. Then a slightly tilted nanowires sample with round top was phenomenologically modelled by a two layers model with a first top layer of an effective medium which includes a volume scattering contribution (Mie theory). Roughness and waviness are added to account for the nanowires small and large scale fluctuation in height. This phenomenological description was proven to be feasible by fitting experimental data. As a conclusion, light transmitted through randomly distributed nanowires can be explained by the combination of volume and surface scatterings using respectively Mie theory and rough Fresnel coefficients at the interfaces.

Additional details

Identifiers

DOI
10.1016/j.tsf.2019.01.054;
PII
S0040609019300707;

Publishing Information

Journal Title
Thin Solid Films (Print)
Journal Volume
675
Journal Page Range
p. 43-49
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Switzerland
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55041125
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
COMPUTERIZED SIMULATION; FRESNEL COEFFICIENT; GEOMETRY; NANOWIRES; RANDOMNESS; ROUGHNESS; SCATTERING; SURFACES; THIN FILMS
Descriptors DEC
FILMS; MATHEMATICS; NANOSTRUCTURES; SIMULATION; SURFACE PROPERTIES

Optional Information

Copyright
Copyright (c) 2019 Published by Elsevier B.V.