Published January 28, 2004
| Version v1
Journal article
X-Ray single-crystal investigation of rare earth osmium silicides
Description
The crystal structure of the Nd2Os3Si5 compound was refined from single-crystal X-ray diffraction (P4/mnc space group, a=10.762(5) A, c=5.796(2) A) down to R=0.0662 for 393 reflections with F0>4σ(F0). This compound belongs to a partly disordered U2Mn3Si5 type structure: the Si2 site has been refined with a split position x,y,z (16i) instead of x,x+1/2,1/4 (8g), and for an occupancy of 50%. X-Ray single-crystal investigations of the PrOs2Si2 and Ce(Ru0.6Os0.4)2Si2 compounds were also performed for the first time. Both compounds crystallize in the CeGa2Al2 structure type, I4/mmm space group, with a=4.1678(4) A, c=9.901(1) A, R=0.0433 and a=4.173(1) A, c=9.797(3) A, R=0.0393, respectively
Additional details
Identifiers
- DOI
- 10.1016/S0925-8388;
- PII
- S0925838803004705;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 363
- Journal Issue
- 1-2
- Journal Page Range
- p. 222-227
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37047899
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- MONOCRYSTALS; OSMIUM COMPOUNDS; SILICIDES; SPACE GROUPS; TETRAGONAL LATTICES; X RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS; REFRACTORY METAL COMPOUNDS; SCATTERING; SILICON COMPOUNDS; SYMMETRY GROUPS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.