Published November 1, 2019
| Version v1
Journal article
The role of the semiconductor layer in the exchange-bias film structure of CoNi / Si / FeNi / Si with a spin spring effect
Creators
- 1. Siberian Federal University, prospect Svobodny, 79, Krasnoyarsk, 660041 (Russian Federation)
- 2. L.V. Kirensky Institute of Physics of Siberian Branch of Russian Academy of Sciences, Krasnoyarsk, 660036 (Russian Federation)
Description
CoNi / Si / FeNi / Si structures were synthesized by ion-plasma sputtering. A negative hysteresis loop bias was detected at the thickness of the silicon layer was less than 2 nm and the temperature was less than 100 K. A positive hysteresis loop bias was detected at the thickness of the silicon layer was more than 2 nm and the temperature greater than 100K. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/1389/1/012028Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 1389
- Journal Issue
- 1
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- 7. Euro-Asian Symposium Trends in Magnetism
- Dates
- 8-13 Sep 2019
- Place
- Ekaterinburg (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53062783
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- IONS; LAYERS; PLASMA; SEMICONDUCTOR MATERIALS; SILICON; SPIN; THICKNESS; THIN FILMS
- Descriptors DEC
- ANGULAR MOMENTUM; CHARGED PARTICLES; DIMENSIONS; ELEMENTS; FILMS; MATERIALS; PARTICLE PROPERTIES; SEMIMETALS