NIRS report of investigations for the development of the next generation PET apparatus. FY 2000
Description
This is a summary of study reports from representative technology fields for the development of the next generation PET apparatus directing to 3-D images, and is hoped to be useful for future smooth cooperation between the fields. The investigation started from April 2000 in National Institute of Radiological Sciences (NIRS) with cooperation of other facilities, universities and companies. The report involves chapters of: Detector volume and geometrical efficiency- Design criterion for the next generation PET; Scintillator for PET; An investigation of detector and front-end electronics for the next generation PET; A measurement system of depth of interaction; Detector simulator; Development of an evaluation system for PET detector; On the signal processing system for the next generation PET; List-mode data acquisition method for the next generation PET; List-mode data acquisition simulator; Image reconstruction; A Monte Carlo simulator for the next generation PET scanners; Out-of-field of view (FOV) radioactivity; and Published papers and presentations. (N.I.)
Availability note (English)
Available from National Institute of Radiological Sciences, 4-9-1, Anagawa, Inage-ku, Chiba-shi, Chiba-ken 263-8555, JapanAdditional details
Publishing Information
- Imprint Pagination
- 69 p.
- Report number
- NIRS-M--145
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 34049412
- Subject category
- S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- BGO DETECTORS; COMPUTERIZED SIMULATION; IMAGE PROCESSING; MONTE CARLO METHOD; NAI DETECTORS; PHANTOMS; POSITRON COMPUTED TOMOGRAPHY; SCATTERING; SEMICONDUCTOR DETECTORS; SPATIAL RESOLUTION; THREE-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- CALCULATION METHODS; COMPUTERIZED TOMOGRAPHY; DIAGNOSTIC TECHNIQUES; EMISSION COMPUTED TOMOGRAPHY; MEASURING INSTRUMENTS; MOCKUP; PROCESSING; RADIATION DETECTORS; RESOLUTION; SCINTILLATION COUNTERS; SIMULATION; SOLID SCINTILLATION DETECTORS; STRUCTURAL MODELS; TOMOGRAPHY