Published June 2004 | Version v1
Journal article

Characterization of FePt nanoparticles in FePt/C multilayers

Description

The areal density growth of recording media is expected to reach 100 Gbit/in.2 within a few years. Such high densities require magnetic grain sizes of 10 nm or less, which is close to the superparamagnetic limit of current media. Therefore, in order to retain thermal stability, it is essential to use a magnetic material with high anisotropy energy. Ordered metallic phases such as FePt and CoPt, which have very large magnetocrystalline anisotropy, are regarded as attractive candidates. We have deposited at different temperatures by ion beam sputtering C/(FePt/C)x20 multilayers, with nominal thickness tC=4 nm and tFePt=1 nm. The FePt consists of nanoparticles embedded in the C matrix. Using Rutherford backscattering at grazing angles of incidence, we determined the stoichiometry of the nanoparticles, the multilayer periodicity and the nanoparticle height. We compare the results with X-ray reflectivity, grazing incidence small-angle X-ray scattering, and transmission electron microscopy results

Additional details

Identifiers

DOI
10.1016/j.nimb.2004.01.188;
PII
S0168583X04002381;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
219-220
Journal Issue
4
Journal Page Range
p. 919-922
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
16. international conference on ion beam analysis
Dates
29 Jun - 4 Jul 2003
Place
Albuquerque, NM (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
Brazil
INIS RN
35105756
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
INCIDENCE ANGLE; ION BEAMS; IRON ALLOYS; NANOSTRUCTURES; PLATINUM ALLOYS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SMALL ANGLE SCATTERING; SPUTTERING; THICKNESS; THIN FILMS
Descriptors DEC
ALLOYS; BEAMS; DIMENSIONS; FILMS; PLATINUM METAL ALLOYS; SCATTERING; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.