Singles time stamped data in In-beam spectroscopy
Creators
- 1. Saha Institute of Nuclear Physics, Homi Bhabha National Institute, Kolkata (India)
Description
The advancement in technology has stimulated the path of evolution in digital signal processing. It has offered experimentalists to substitute the analog electronics by real time digital acquisition technique by using a complete, compact system - Digitiser. This can be used in in-beam or off-beam measurements. In the present work, we shall demonstrate the advantage of using singles time-stamped data from a detector acquired by a digitiser to monitor beam characteristics. Minute details of beam intensity and beam tuning variations can be monitored continuously with such data. In the study of nuclear isomers, having half-lives around a few seconds or minutes, the reaction products are carried out to a low back-ground detection site using Recoil transport technique. But this method is quite involved and needs several mechanical arrangements. Usage of time stamped singles data using a digitiser can be useful to measure these half-lives also
Additional details
Publishing Information
- Publisher
- Bhabha Atomic Research Centre
- Imprint Place
- Mumbai (India)
- Imprint Title
- Proceedings of the DAE international symposium on nuclear physics. V. 63
- Imprint Pagination
- 1300 p.
- Journal Page Range
- p. 1144-1145
Conference
- Title
- 63. DAE international symposium on nuclear physics
- Dates
- 10-14 Dec 2018
- Place
- Mumbai (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 50012069
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM DYNAMICS; DIGITIZERS; HIGH-PURITY GE DETECTORS; ISOMERIC NUCLEI; PROTON BEAMS
- Descriptors DEC
- BEAMS; DYNAMICS; ELECTRONIC CIRCUITS; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; MECHANICS; NUCLEI; NUCLEON BEAMS; PARTICLE BEAMS; PULSE CIRCUITS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SIGNAL CONDITIONERS
Optional Information
- Notes
- 3 refs., 2 figs.