Published May 23, 2005 | Version v1
Journal article

Arsenic activation in molecular beam epitaxy grown, in situ doped HgCdTe(211)

  • 1. Air Force Research Laboratory, Space Vehicles Directorate, Kirtland AFB, New Mexico 87117 (United States)
  • 2. EPIR Technologies Inc., Bolingbrook, Illinois 60440 (United States)

Description

Photovoltaic p-n junctions are the most significant active components of both current infrared photodetectors and advanced ones being developed. It is of the utmost importance to control both p- and n-type extrinsic doping. This letter addresses the issue of activating arsenic as a p-type dopant of Hg1-xCdxTe at temperatures sufficiently low that the integrity of p-n junctions and the intrinsic advantages of molecular beam epitaxy as a growth technique will not be compromised. The p-type activation of arsenic in (211)B Hg1-xCdxTe is reported after a two-stage anneal at temperatures below 300 deg. C for Cd compositions suitable for the sensing of long wavelength infrared radiation

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
86
Journal Issue
21
Journal Page Range
p. 212106-212106.3
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2005 American Institute of Physics