Published July 27, 2015 | Version v1
Journal article Metadata-only

Abnormal variation of band gap in Zn doped Bi0.9La0.1FeO3 nanoparticles: Role of Fe-O-Fe bond angle and Fe-O bond anisotropy

Creators

  • 1. Tianjin Key Laboratory of Low Dimensional Materials Physics and Preparing Technology, School of Science, Tianjin University, Tianjin 300072 (China)
  • 2. College of Physics and Materials Science, Tianjin Normal University, Tianjin 300074 (China)
  • 3. Department of Physics, The University of Hong Kong, Pokfulam Road (Hong Kong)
  • 4. Department of Information Materials Science and Engineering, Guilin University of Electronic Technology, Guilin 541004, Guangxi (China)

Description

Bi0.9La0.1FeO3 (BLFO) and Bi0.9La0.1Fe0.99Zn0.01O3 (BLFZO) nanoparticles were prepared via a sol-gel method. The oxygen vacancies and holes increase with Zn doping analyzed through X-ray photoelectron spectroscopy, which could contribute to the increase of leakage current density. However, with the increase of the defects (oxygen vacancies and holes), the band gap of BLFZO also is increased. To explain the abnormal phenomenon, the bandwidth of occupied and unoccupied bands was analyzed based on the structural symmetry driven by the Fe-O-Fe bond angle and Fe-O bond anisotropy

Additional details

Identifiers

DOI
10.1063/1.4927644;

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
107
Journal Issue
4
Journal Page Range
p. 042905-042905.5
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47056370
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
ANISOTROPY; BOND ANGLE; CURRENT DENSITY; DOPED MATERIALS; HOLES; LEAKAGE CURRENT; NANOPARTICLES; OXYGEN; SOL-GEL PROCESS; SYMMETRY; VACANCIES; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CURRENTS; ELECTRIC CURRENTS; ELECTRON SPECTROSCOPY; ELEMENTS; MATERIALS; NONMETALS; PARTICLES; PHOTOELECTRON SPECTROSCOPY; POINT DEFECTS; SPECTROSCOPY

Optional Information

Notes
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